Differential Near-Field Scanning Optical Microscopy with THz quantum cascade laser sources
نویسندگان
چکیده
منابع مشابه
Heterodyne near-field scanning optical microscopy with spectrally broad sources.
We propose to use low-coherence-length cw optical sources with a broad spectrum in heterodyne near-field scanning microscopy in order to imitate optical pulse propagation and to obtain information about spectrally variant properties of nanophotonic components. The dispersion difference in the interferometer arms for a symmetric acousto-optic modulator arrangement is shown to be negligible over ...
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An average human eye can see details down to 0,07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today's science needs eyes for the nano-world. Examples are easily found in biology and medical sciences. There is a great need to determine shape, size, chemical composition, molecular structure and...
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Near-field scanning optical microscopy (NSOM) is a powerful alternative method to observe the optical intensity distributions in fabricated nanophotonic structures. Several groups have obtained NSOM images of photonic crystal (PC) [1-2]. Quite recently, we have reported the optical mode images obtained by NSOM on compact PC cavities based on fractional edge dislocations [3]. Here we report high...
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Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2009
ISSN: 1094-4087
DOI: 10.1364/oe.17.023785